SEM-EDS检测_检测机构_检测报告_中析研究所「检测中心」

检测范围

黑色金属及其合金显微组织与夹杂物分析
有色金属及合金相组成与微区成分检测
陶瓷材料微观结构与晶界析出相分析
玻璃材料缺陷与微小结石成分鉴定
高分子材料断面形貌与填料分布观察
复合材料界面结合状态及元素扩散检测
半导体芯片封装结构与焊线界面微区成分分析
印刷电路板焊点金属间化合物厚度与成分测量
薄膜与表面镀层截面元素分布梯度检测
热喷涂涂层孔隙率与氧化物夹杂分析
矿物岩石单矿物相组成与微区元素鉴定
地质土壤中黏土矿物及微小颗粒物形貌成分检测
煤岩显微组分形态与无机矿物杂质分析
环境粉尘单颗粒形貌与元素组成溯源
大气颗粒物PM2.5及PM10单颗粒成分检测
电池极片材料微观结构及元素面分布分析
催化剂载体表面活性组分分散度及微区成分检测
水泥熟料矿物相形貌与元素组成分析
耐火材料骨料与基质界面结合及成分迁移检测
腐蚀产物膜层形貌及腐蚀介质元素分布分析
摩擦磨损表面磨痕形貌与转移层成分检测

检测标准（部分）

IES SEM-11-14 IES Seminar - Light Sources & Auxiliary Devices
IES SEM-11-IM-14 IES Seminar - Light Sources & Auxiliary Devices - Instructor's Manual
NEMA SEM S1-2018 Small Electric Motors
IES SEM-4-14 IES Seminar - Lighting Controls For Non-Residential Building
GB/T 20726-2025 微束分析扫描电子显微镜（SEM）或电子探针显微分析仪（EPMA）用X射线能谱仪（EDS）主要性能参数及核查方法
T/CIET 1253-2025 扫描电镜-能谱仪(SEM-EDS)分析技术规范
ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
ISO 15632:2021 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
ASTM E3309-21 Standard Guide for Reporting of Forensic Primer Gunshot Residue (pGSR) Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
ASTM E3345-26 Standard Practice for Opinions on the Interpretation of Primer Gunshot Residue (pGSR) Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
ASTM E3284-23 Standard Practice for Training in the Forensic Examination of Primer Gunshot Residue (pGSR) Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2021)
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
KS D ISO 15632 마이크로빔 분석 — 주사전자현미경(SEM) 또는 전자 탐침 미소분석기(EPMA)에서 사용하는 에너지 분산 엑스선 분광기(EDS)의 사양과 점검을 위해 선택한 기기 성능 파라미터
KS D ISO 15632-2023 마이크로빔 분석 — 주사전자현미경(SEM) 또는 전자 탐침 미소분석기(EPMA)에서 사용하는 에너지 분산 엑스선 분광기(EDS)의 사양과 점검을 위해 선택한 기기 성능 파라미터
DIN ISO 15632:2022-03 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2021); Text in German and English
GB/T 17362-2008 黄金制品的扫描电镜X射线能谱分析方法
GB/T 25189-2010 微束分析扫描电镜能谱仪定量分析参数的测定方法
GB/T 46057-2025 微束分析扫描电子显微术 CD-SEM评定关键尺寸的方法
GA/T 909-2010 微量物证的提取、包装方法　扫描电子显微镜/能谱法检验射击残留物